Signal Integrity Measurements by LeCroy

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This seminar is sponsored by ACA TMetrix and LeCroy. Demo equipment and literature will be available at the event. There is no charge for this seminar.

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NOTE: you will receive a phone call or e-mail 48 hours before the event confirming the time and location.

Seminar Information

This seminar is presented by Michael Schnecker, Business Development Manager, Signal Integrity, LeCroy Corporation.

Topics Include:

  • Jitter Measurement
    • Timing measurement
    • Histograms
    • The Dual Dirac jitter model, total jitter and jitter breakdown
    • Jitter transfer function
    • Crosstalk and jitter
    • Example: 3 Gb/s SATA signal
  • Compensating for fixture and probe affects
    • Channel bandwidth affects on serial data signals
    • Virtual Probing
    • Example: 5 Gb/s PCIe gen 2 signal
  • Measuring stressed eye patterns
    • Sources of stress: ISI, Pj, Rj
    • Limitations of measurement equipment
    • Using Virtual Probe to improve accuracy
    • Example: 5 Gb/s PCIe signal through backplane
  • Signal Integrity in Equalized Receivers
    • Equalization basics
    • Limitations of conventional methods: eye closure
    • Simulating equalizers in software
    • Example: 5 Gb/s PCIe signal through backplane

Seating for this event is on a first come first served basis.

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